MarSurf WI 50
Flexible all-round measuring solution
The MarSurf WI 50 is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast.
Flexible all-round measuring solution
Flexible all-round measuring solutions all the time - wherever it comes down to sub-nanometers: That’s what the MarSurf WI 50 stands for. The high-precision measuring tools for research and quality assurance deliver reliable 3D measuring values – quickly and easily in just a few steps. Thanks to its HD stitching function, the MarSurf WI 50 boasts consistently high resolution, even on large measuring surfaces. The integrated collision detection offers users a high level of safety in all directions – both for the workpiece and the instrument itself.
Flexible all-round measuring solutions all the time - wherever it comes down to sub-nanometers: That’s what the MarSurf WI 50 stands for. The high-precision measuring tools for research and quality assurance deliver reliable 3D measuring values – quickly and easily in just a few steps. Thanks to its HD stitching function, the MarSurf WI 50 boasts consistently high resolution, even on large measuring surfaces. The integrated collision detection offers users a high level of safety in all directions – both for the workpiece and the instrument itself.
Typical measuring tasks
- Roughness measurements as per
ISO 4287 & ISO 13565 / ISO 25178 - Topography measurements (including volume, wear, tribology)
- contour and form (2D, 3D)
- pore, particle analysis
- defect detection
Maximum data quality
One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.
| MarSurf WI 50 | Art.-Nr. 6355001 | |
|---|---|
| Measuring speed | up to 140 fps |
| Resolution | up to 0.2 (nm) vertical |
| Measuring principle | White light interferometer High-power LED (650 nm / white) |
| Other | Collision detection in xyz direction |
| Power supplied | 100 - 240 V |
| Surface parameters | ISO 4287, ISO 13565, ISO 25178 … |
Variety of applications for our products
Machine building
Qualification and quantification of the roughness, geometry, and wear volumeElectronic system and semiconductors
Component inspection right down to sub-nanometer range for fault-free productsMedical technology
Quality assurance of medical surfaces in production and the laboratoryMaterials science
Optimization of functional features on new surfaces and products
Qualification and quantification of the roughness, geometry, and wear volumeElectronic system and semiconductors
Component inspection right down to sub-nanometer range for fault-free productsMedical technology
Quality assurance of medical surfaces in production and the laboratoryMaterials science
Optimization of functional features on new surfaces and products
Micro-system technology
Measurement of complex surface geometries of the smallest components with nanometer precision
Quick Results
Simple Operations
Robust, reliable, and highly accurate
Reliable and Safe
Highlighted Features
Increased efficiency
Handle complex measuring
Reliable and safe
Kalimetrics