MarSurf M 400. The best of the "mobile" devices
Both in the measuring room and increasingly also in the production area, there is a need for surface evaluations requiring skidless tracing.
This generally requires more highly skilled operators, more time and more adjustment work.
Within the "mobile surface metrology" range, MarSurf M 400 provides the necessary range of functions, while at the same time being quick and easy to use.
|MarSurf M 400 | Art.-Nr. 6910404|
|Positioning speed||0.5; 1.0|
|Measuring principle||Stylus method|
|Probe||BFW skidless system|
|Measuring range mm||+/- 250 µm (up to +/- 750 µm with 3x probe arm length)|
|Profile resolution||Measuring range +/- 250 µm: 8 nm|
Measuring range +/- 25 µm: 0.8 nm
|Filter according to ISO/JIS||Gaussian filter as per ISO 11562|
Filter as per ISO 13565
|Cutoff Ic according to ISO/JIS||0,08 mm , 0,25 mm , 0,8 mm , 2,5 mm , automatical , variable|
|Number n of sampling length according to ISO/JIS||1-5|
|Contacting speeds||0,2 mm/s; 1,0 mm/s|
|Measuring force (N)||0.75 mN|
|Weight drive unit||approx. 0.9 kg|
|Weight measuring instrument||approx. 1.0 kg|
|Surface parameters||Over 50 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)|