Description
MarSurf M 400. The best of the “mobile” devices
Both in the measuring room and increasingly also in the production area, there is a need for surface evaluations requiring skidless tracing.
This generally requires more highly skilled operators, more time and more adjustment work.
Within the “mobile surface metrology” range, MarSurf M 400 provides the necessary range of functions, while at the same time being quick and easy to use.
| MarSurf M 400 | Art.-Nr. 6910404 | |
|---|---|
| Positioning speed | 0.5; 1.0 |
| Measuring principle | Stylus method |
| Probe | BFW skidless system |
| Measuring range mm | +/- 250 µm (up to +/- 750 µm with 3x probe arm length) |
| Profile resolution | Measuring range +/- 250 µm: 8 nm Measuring range +/- 25 µm: 0.8 nm |
| Filter according to ISO/JIS | Gaussian filter as per ISO 11562 Filter as per ISO 13565 |
| Cutoff Ic according to ISO/JIS | 0,08 mm , 0,25 mm , 0,8 mm , 2,5 mm , automatical , variable |
| Number n of sampling length according to ISO/JIS | 1-5 |
| Contacting speeds | 0,2 mm/s; 1,0 mm/s |
| Stylus | 2 µm |
| Measuring force (N) | 0.75 mN |
| Weight drive unit | approx. 0.9 kg |
| Weight measuring instrument | approx. 1.0 kg |
| Surface parameters | Over 50 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085) |
