Description
Flexible solution for quality control
The MarSurf CP select stands out for the extremely fast recording of large measuring surfaces while also ensuring high measuring precision. Thanks to its modular design, the measuring system can be adjusted to various measuring tasks and individual automation, measuring convenience, and accuracy requirements.
Typical measuring tasks
- Roughness measurements as per ISO 4287 & ISO 13565 / ISO 25178
- Topography measurements (including volume, wear, tribology)
- Layer thickness measurement
- contour and form (2D, 3D)
- Macro and micro geometries
- Determination of flatness and coplanarity
Maximum data quality
One of our most important criteria, which equates to excellent precision, accuracy, reproducibility and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design and quality control areas etc.
| MarSurf CP select | Art.-Nr. 6350010 | |
|---|---|
| Workpiece weight (max.) in kg | 10 kg |
| Measuring speed | 4 kHz |
| Measuring principle | Chromatic-confocal |
| Languages | German , English , French , Italian , Spanish , Portugese , Polish , Russian , Turkish , Chinese , Japanese , Korean |
| Power supplied | 100 – 240 V |
| Surface parameters | ISO 4287, ISO 13565, ISO 25178, … |
Variety of applications for our products
Mechanical Engineering
To qualify and quantify roughness, geometry and wear volumeElectronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products
To qualify and quantify roughness, geometry and wear volumeElectronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products
Medical Technology
Quality assurance of medical surfaces in production and laboratory
Material Science
Optimization of functional properties of new surfaces and products
Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision
