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MarSurf CM select

MarSurf CM select

Measuring solution adapted to the application

The MarSurf CM select is a powerful, configurable confocal microscope for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast.

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Description

Typical measuring tasks

  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection

Measuring solution adapted to the application

As a multi-sensor system, the MarSurf CM select offers the possibility of combining different sensor technologies in one measuring device. Depending on the measuring task, the optimal point sensor can also be flexibly selected. The MarSurf CM select meets your individual requirements for sample size, automation, measuring comfort and accuracy – right up to the fully automated measuring solution.

Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, reproducibility, and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design, and quality control areas.

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