MarSurf CM expert

High-performance laboratory and QA system

The MarSurf CM expert is a powerful confocal microscope for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast.

High-performance laboratory and QA system

The MarSurf CM expert is suitable for use in test laboratories and equipped for quality assurance in production environments due to its robust construction and insensitivity to environmental influences.
With additional manual Z positioning, a large x and y travel range and the possibility of automation, it offers excellent ease of use.

Typical measuring tasks

  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
Maximum data quality
 
One of our most important criteria, which equates to excellent precision, accuracy, repeatability, reproducibility and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design and quality control areas etc.
MarSurf CM expert | Art.-Nr. 6350002
Workpiece weight (max.) in kg10 kg
Measuring speedup to 100fps
Resolutionup to 2 (nm) vertical
Measuring principleConfocal
High-performance LED (505nm / white)
LanguagesGerman , English , French , Italian , Spanish , Portugese , Polish , Russian , Turkish , Chinese , Japanese , Korean
OtherCollision detection in xyz direction
Power supplied100 - 240 V
Surface parametersISO 4287, ISO 13565, ISO 25178, …

 

Variety of applications for our products

Mechanical Engineering
To qualify and quantify roughness, geometry and wear volumeElectronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free productsMedical Technology
Quality assurance of medical surfaces in production and laboratory

Material Science
Optimization of functional properties of new surfaces and products

Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision

Quick Results

Simple Operations

Robust, reliable, and highly accurate

Reliable and Safe

Highlighted Features

Increased efficiency

Handle complex measuring

Reliable and safe

Kalimetrics

Financing Available